The patent covers the workings of EVS’s iBar product for on-loom inspection of woven fabrics in order to identify weaving faults during manufacture.

Benchmark for defect identification

“While protecting our intellectual property is certainly a priority, our goal for this patent has a much more strategic significance. For the first time, EVS will be able to quantify exactly what makes an imperfection a defect,” commented Mr Sam Cohen, CEO of EVS.

“By measuring the exact dimensions that turn a subjective flaw into an objective fault, we intend to eliminate the subjectivity of defects from textile manufacturing. By establishing measurable dimensions for defects, EVS can ensure the market has an accurate, reliable and repeatable way to create global quality standards. This will position the EVS standard as the benchmark for defect identification, against which all other systems will be measured.”

Elbit Vision Systems

EVS offers a broad portfolio of automatic State-of-the-Art Visual Inspection Systems for both in-line and off-line applications, and process monitoring systems used to improve product quality, safety, and increase production efficiency.  EVS's systems are used by over 800 customers, many of which are leading companies operating globally.

www.evs.co.il